XRD Analysis of Polyaniline Thin Films Doped with Potassium Bromide and Picric Acid

AUTHOR(S)

Pradeep Kumar, Nempal Singh

DOI: https://doi.org/10.46647/ijetms.2023.v07i04.024

ABSTRACT
The unique properties of conducting polymers not only provide great scope for their applications but also have led to the development of new models to explain their observed properties. Polyaniline has been the oldest among all the conducting polymers. Polyaniline has rapidly become the subject of considerable interest for physicists, chemists and material scientists. In this paper we have carried out the X-Ray Diffractional analysis of Polyaniline thin films doped with different concentrations (15% & 30%) of the dopants like Potassium Bromide and Picric Acid. The films has been prepared by using Vacuum Evaporation Technique and then characterized for XRD studies by using the X-Ray Diffractometer. The XRD studies reveals that the crystallinity of the doped polyaniline thin films has been increased with the increased doping concentration of the above said dopants which ensures its applications in the optoelectronic device technology.

Page No: 156 - 160

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How to Cite This Article:
Pradeep Kumar, Nempal Singh . ijetms;7(4):156-160. DOI: 10.46647/ijetms.2023.v07i04.024